High speed double data rate jtag interface

ABSTRACT

A process and apparatus provide a JTAG TAP controller ( 302 ) to access a JTAG TAP domain ( 106 ) of a device using a reduced pin count, high speed DDR interface ( 202 ). The access is accomplished by combining the separate TDI and TMS signals from the TAP controller into a single signal and communicating the TDI and TMS signals of the single signal on the rising and falling edges of the TCK driving the DDR interface. The TAP domain may be coupled to the TAP controller in a point to point fashion or in an addressable bus fashion. The access to the TAP domain may be used for JTAG based device testing, debugging, programming, or other type of JTAG based operation.

CROSS REFERENCE TO RELATED PATENTS

This application is a divisional of application Ser. No. 13/671,751,filed Nov. 8, 2012, currently pending;

Which was a divisional of application Ser. No. 13/241,503, filed Sep.23, 2011, now abandoned;

Which was a divisional of application Ser. No. 12/957,904, filed Dec. 1,2010, now U.S. Pat. No. 8,051,351, granted Nov. 1, 2011;

Which was a divisional of application Ser. No. 12/758,143, filed Apr.12, 2010, now U.S. Pat. No. 7,870,450, granted Jan. 11, 2011;

Which was a divisional of application Ser. No. 11/874,714, filed Oct.18, 2007, now U.S. Pat. No. 7,725,791, granted May 5, 2010;

and claims priority from Provisional Application 60/862,298, filed Oct.20, 2006.

FIELD OF THE DISCLOSURE

This disclosure relates to a JTAG interface that uses double data ratecircuitry for accessing devices on a substrate using a reduced number ofdevice pins.

BACKGROUND OF THE DISCLOSURE

Electrical devices, which may be boards, ICs or embedded cores withinICs, use JTAG interfaces to provide for testing and debugging of thedevice's hardware and software designs. In the past, device test anddebug interfaces used the full pin JTAG interface consisting of a TDI,TCK, TMS, TDO, and an optional TRST pin. More recently, reduced pin JTAGinterfaces are being developed and used for test and debug when devicepins are not available for the full pin JTAG interface. Some knownreduced pin JTAG interfaces include; (1) a simultaneously bidirectionaltransceiver (SBT) based reduced pin JTAG interface described in a 2006International Test Conference paper by Whetsel which is incorporated byreference herein, (2) an IEEE standard P1149.7 described in a whitepaper which is incorporated by reference herein, (3) a JTAG Link (JLINK)interface developed by DebugInnovations which is incorporated byreference herein, and (4) a single wire JTAG (SWJ) interface developedby ARM Ltd which is incorporated by reference herein. Reducing thenumber of JTAG pins, while enabling access to pin limited device, bringsabout a reduction in the communication bandwidth between a JTAGcontroller and JTAG device. The disclosure describes a JTAG interfacebased on double data rate circuitry that reduces JTAG pins whileadvantageously maintaining a high communication bandwidth between a JTAGcontroller and JTAG device. The double data rate JTAG interface may beused for device test, debug, programming or other operations performedtoday by the JTAG bus.

FIG. 1 illustrates an example of a full pin JTAG interface bus 102coupled between a JTAG TAP controller 104 and JTAG TAP domain 106 withina device 108. The TAP domain is an IEEE 1149.1 based architecture thatincludes a TAP state machine, an instruction register, and plural dataregisters. The TAP domain 106 may be used for testing, debugging, orprogramming of the device 108. The full pin JTAG (IEEE 1149.1) interface102 comprises a TDI, TCK, TMS, TDO and optionally a TRST signal. Pull up(PU) elements 105 are required on the TDI and TMS inputs of the device108 to pull these signals high if they are not externally driven by thecontroller 104. Pulling TMS high causes the TAP state machine of the TAPdomain 106 to remain in the Test Logic Reset state of FIG. 12A. If theoptional TRST signal is not used, a power up reset (POR) circuit 110 maybe used in the device 108 to reset the TAP domain when the device powersup. The device's TAP domain 106 can also be reset by an input sequencefrom the TAP controller 104 on bus 102.

Timing diagram 110 illustrates the operation of JTAG bus 102 during ascan operation. As seen, the TAP controller 104 outputs TDI and TMSsignals to the TAP domain 106 on the falling edge 114 of the TCK and theTAP domain samples the TDI and TMS signals on the rising edge of the TCK116. The TAP domain 106 outputs the TDO signal to the TAP controller 104on the falling edge 114 of the TCK and the TAP controller samples theTDO signal on the rising edge 116 of the TCK. The timing operation ofthe JTAG bus 102 between the TAP controller 104 and TAP domain 106 1 iswell known and broadly used in the industry for serially accessingdevices for test, debug, programming and/or other operations.

FIG. 2 illustrates an example of a double data rate (DDR) circuit 202interfaced between a sending circuit 204 and a receiving circuit 206.The DDR circuit 202 comprises flip flops 208-214 arranged as shown. Thesending circuit 204 outputs an A/B data signal and a clock signal to theDDR circuit 202. The clock signal output from the sending circuit 204 isalso input to the receiving circuit 206. The data inputs of Flip flops208 and 210 are coupled to the A/B data output signal from sendingcircuit 204 and their clock inputs are coupled to the clock outputsignal from sending circuit 204. The data input of flip flop 212 iscoupled to the data output of flip flop 208 and the data input of flipflop 214 is coupled to the data output of flip flop 210. The clockinputs of flip flops 212 and 214 are coupled to the sending circuit'sclock output signal.

As seen in timing diagram 216, the sending circuit outputs serial A 218and B 220 data components on the A/B signal to the DDR circuit 202during each clock output signal 228-236. Flip flop 208 stores the A datacomponent 218 during the rising edge 224 of the clock signal 222 andflip flop 210 stores the B data component 220 on the falling edge 226 ofthe clock signal 222. The A data component 218 and B data component 220stored into flip flops 208 and 210 are transferred into flip flops 212and 214, respectively, on the rising edge 224 of the next clock period230. The A and B data components stored into flip flops 212 and 214 aretransferred into the receiving circuit 206 on the rising edge 224 of thenext clock signal 232. This process of serially inputting A and B datacomponents from the A/B signal output from the sending circuit 204followed by outputting the A and B data components in parallel to thereceiving circuit 206 is repeated during the operation of the DDRcircuit. DDR circuits are high speed circuits and can transfer data wellabove 100 MHz.

As will be described below, the disclosure takes advantage of the highspeed DDR circuit's ability to serially input two data components, A 218and B 220, from a single output of a sending circuit during the rising224 and falling 226 edges of a first clock signal 228 respectively,separate and output the A and B components during the rising edge 224 asecond clock signal 230, and input the separated A and B components inparallel to a receiving circuit on the rising edge 224 of a third clocksignal 232.

BRIEF SUMMARY OF THE DISCLOSURE

The disclosure provides a high speed, reduced pin count JTAG deviceinterface utilizing double data rate circuitry. The interface of thedisclosure also provides for device addressing and TAP domain selectionwithin an addressed device.

BRIEF DESCRIPTION OF THE VIEWS OF THE DRAWINGS

FIG. 1 illustrates an interface between a JTAG TAP controller and a TAPdomain within a device.

FIG. 2 illustrates a double data rate (DDR) circuit for communicatingdata between a sending and receiving circuit.

FIG. 3 illustrates a DDR circuit for communicating TDI and TMS signalsfrom a TAP controller to a TAP domain according to the disclosure.

FIG. 3A illustrates an example of a TAP controller interfaced to anadapter for communicating TDI and TMS signals to a TAP domain via theDDR circuit of FIG. 3 according to the disclosure.

FIG. 3B illustrates an example implementation of the adapter of FIG. 3A.

FIG. 3C illustrates a timing diagram of the operation of the adaptercircuit of FIG. 3B.

FIG. 4 illustrates the DDR circuit of FIG. 3 adapted to meet JTAG signaltiming suggested in IEEE standard 1149.1.

FIG. 5 illustrates a first example JTAG DDR interface between a TAPcontroller and TAP domain according to the disclosure.

FIG. 5A illustrates a second example JTAG DDR interface between a TAPcontroller and TAP domain according to the disclosure.

FIG. 6 illustrates a third example JTAG DDR interface between a TAPcontroller and TAP domain according to the disclosure.

FIG. 7 illustrates a TAP controller interfaced to plural devices viaseparate busses according to the disclosure.

FIG. 8 illustrates a TAP controller interfaced to plural devices via acommon bus according to the disclosure.

FIG. 9 illustrates the JTAG DDR interface to a device that includesdevice addressing circuitry according to the disclosure.

FIG. 10 illustrates an example implementation of the addressing circuitof FIG. 9.

FIG. 11 illustrates an example implementation of the controller of theaddressing circuit of FIG. 10.

FIG. 12A illustrates the IEEE 1149.1 TAP state diagram.

FIG. 12B illustrates the state diagram of the controller of FIG. 11.

FIG. 12C illustrates an example implementation of the controller of FIG.12B.

FIG. 12D illustrates an example implementation of the address circuit ofFIG. 11.

FIG. 13 illustrates the JTAG DDR interface to a device that includesdevice addressing circuitry and TAP domain linking circuitry accordingto the disclosure.

FIG. 14 illustrates the addressing and linking circuitry of FIG. 13 inmore detail.

FIG. 15 illustrates an example implementation of the addressing andlinking circuit of FIG. 14.

FIG. 16 illustrates an example implementation of the controller,addressing and linking circuit of FIG. 15.

FIG. 17 illustrates the state diagram of the controller of FIG. 16.

FIG. 18A illustrates an example implementation of the controller of FIG.16.

FIG. 18B illustrates an example implementation of the address circuit ofFIG. 16.

FIG. 18C illustrates an example implementation of the command circuit ofFIG. 16.

FIG. 19 illustrates an example implementation of the TAP domaininterface circuit of FIG. 14.

FIG. 20 illustrates a simultaneously bi-directional transceiver (SBT)interface between two circuits.

FIG. 21 illustrates the four operational cases of SBT circuitcommunication.

FIG. 22 illustrates a first example of using SBT circuit communicationbetween a DDR TAP controller and DDR TAP domain within a deviceaccording to the disclosure.

FIG. 22A illustrates a second example of using SBT circuit communicationbetween a DDR TAP controller and DDR TAP domain within a deviceaccording to the disclosure.

FIG. 22B illustrates a third example of using SBT circuit communicationbetween a DDR TAP controller and DDR TAP domain within a deviceaccording to the disclosure.

FIG. 23 illustrates an example of using SBT circuit communicationbetween a DDR TAP controller and an addressable DDR TAP domain within adevice according to the disclosure.

DETAIL DESCRIPTION OF THE DISCLOSURE

FIG. 3 illustrates the DDR circuit 202 of FIG. 2 being used to provide ahigh speed, reduced pin JTAG interface between a TAP controller 302 anda TAP domain 106 within a device, according to the disclosure. Thereduced pin interface is achieved by combining the separate TDI and TMSsignals of the TAP controller 104 of FIG. 1 into serialized signalcomponents that are output from the TAP controller 302 to DDR circuit202 via the single TDI/TMS signal from TAP controller 302. As seen inthe timing diagram, the operation of the DDR circuit is the same asdescribed in FIG. 2. The only differences are that the A component ofthe A/B signal from the sending circuit 204 is now the TDI component ofthe TDI/TMS signal from the TAP controller 302, the B component of theA/B signal from the sending circuit 204 is now the TMS component of theTDI/TMS signal from the TAP controller 302, and the clock signal fromsending circuit 204 is now the TCK signal from the TAP controller 302.Rising TCK edges 224 clock in the TDI component of TDI/TMS to DDRcircuit 202 and falling TCK edges 226 clock in the TMS component ofTDI/TMS to DDR circuit 202.

FIG. 3A illustrates an example implementation of the TAP controller 302of FIG. 3, which comprises the TAP controller 104 of FIG. 1 and anadapter circuit 308. The adapter circuit 308 serves to convert theseparate TDI and TMS signal outputs from TAP controller 104 into thesingle TDI/TMS signal output of FIG. 3. The single TDI/TMS signal outputserially transmits the TDI and TMS signal components to the DDR circuit202 of FIG. 3.

FIG. 3B illustrates an example implementation of the adapter circuit308, which comprises a multiplexer 310, a TCK clock doubler 312, a statemachine 314, and flip flops 316 and 318 connected as shown. The clockdoubler 312 inputs the TCK and outputs a doubled TCK signal (2×TCK) tothe state machine 314. The state machine inputs the 2×TCK signal andoutputs a select signal to multiplexer 310 and flip flops 316 and 318.The rising edge of the select signal latches the TDI and TMS signalsfrom TAP controller 104 to multiplexer 310, via flip flops 316 and 318,to keep them stable during the serialization process. The select signalcontrols the multiplexer 310 to alternately output the latched TDI andTMS signals onto the TDI/TMS signal to DDR circuit 202. The clockdoubler 312 and state machine 314 are initialized in response to a lowon the TRST signal output from TAP controller 104.

FIG. 3C illustrates the timing diagram of the operation of adapter 308.As seen, the select signal is controlled by the state machine to causethe multiplexer 310 to output the latched TDI output from TAP controller104 on TDI/TMS so that it is clocked into the DDR circuit 202 on therising edge 224 of the TCK signal which meets the rising edge TDI timingshown in timing diagram 306. Further, the select signal is controlled bythe state machine to cause the multiplexer 310 to output the latched TMSoutput from the TAP controller 104 on TDI/TMS so that it is clocked intothe DDR circuit 202 on the falling edge 226 of the TCK signal whichmeets the falling edge TMS timing shown in timing diagram 306. Thisprocess of controlling the select signal to alternately output TDI andTMS onto TDI/TMS continues.

While the circuit and timing examples shown and described in regard toFIGS. 3, 3A, 3B, and 3C use timing where the TDI component is input tothe DDR circuit 202 on the rising edge of TCK and the TMS component isinput to the DDR circuit 202 on the falling edge of TCK, this need notbe the case. It should be understood that TMS could be input to the DDRcircuit on the rising edge and TDI could be input to the DDR circuit onthe falling edger if so desired.

In comparing the timing diagram 112 of FIG. 1 with the timing diagram306 of FIG. 3 it is seen that the TDI and TMS inputs to the TAP domain106 in FIG. 3 are output from the DDR circuit 202 on the rising edge ofTCK. While this TDI and TMS input timing will operate the TAP domain 106correctly, it does not meet the falling edge TCK timing shown in FIG. 1,which is the suggested TDI and TMS setup timing described in the JTAGIEEE 1149.1 standard. To exactly meet the falling edge TCK setup timingfor the TDI and TMS inputs to the TAP domain 106, the DDR circuit can bemodified as described below in regard to the FIG. 4.

FIG. 4 illustrates a DDR circuit 402 modified to meet the falling edgeTCK setup timing for the TDI and TMS inputs to TAP domain 106. DDRcircuit 402 is the same as the DDR circuit 202 of FIG. 3 with theexception that an additional pair of falling edge flip flops 404 and 406are added between flip flops 212 and 214 and the TAP domain 106 to causethe TDI and TMS signal inputs to the TAP domain 106 to occur on thefalling edge of TCK. With this modification, the DDR circuit 402 exactlymeets the falling edge TCK input of the TDI and TMS signals to the TAPdomain 106.

FIG. 5 illustrates a complete high speed, reduced pin DDR interface 501between TAP controller 302 and TAP domain 106 of a device 502, whichconsists of a TDI/TMS signal, a TCK signal, and a TDO signal. The TRSTsignal to the TAP domain 106 is provided by a POR circuit 110 in thedevice to eliminate the need for the TRST signal in the interface. TheTRST output of the POR circuit 110 is also input to the DDR circuit 202as a preset input (PR) to set the DDR flip flops 208-214 high at powerup. Each DDR flip flop 208-214 will be modified to include a PR inputthat is coupled to the TRST signal, via the DDR PR input, as shown inexample flip flop 504. Presetting the flip flops high at power up causesthe TDI and TMS inputs to the TAP domain 106 to be set high. Setting TMShigh holds the TAP state machine of the TAP domain 106 in the Test LogicReset state shown in FIG. 12A. The PU element 105 is used to maintainthe TDI/TMS input to DDR circuit 202 high when the TDI/TMS input is notexternally driven. With the TDI/TMS input held high, the DDR circuit 202will continue to output highs on TDI and TMS to the TAP domain 106 ifthe TCK is active, which will maintain the TAP state machine of the TAPdomain 106 in the Test Logic Reset state.

The operation of the complete reduced pin DDR interface 501 of FIG. 5 isillustrated in timing diagram 506. The TDI component of the TDI/TMSsignal is clocked into the DDR circuit 202 on the rising edges 224 ofTCK and the TMS component of the TDI/TMS signal is clocked into the DDRcircuit 202 on the falling edges 226 of TCK. The TDO output from TAPdomain 106 is output from the TAP domain 106 on the falling edges 226 ofTCK and sampled into the TAP controller 302 on the rising edges 224 ofthe TCK. As previously mentioned in regard to FIG. 3, and as shown intiming diagram 506, the DDR circuit 202 outputs TDI and TMS to the TAPcontroller on the rising edge of TCK. As mentioned, rising edge input ofTDI and TMS signals from the DDR circuit 202 to TAP domain 106 works butit does not meet the suggested falling TCK edge TDI and TMS input timingstated in the IEEE 1149.1 standard.

It should be noted that inputting TDI and TMS to the TAP domain 106 onthe rising edge of the TCK does have an advantage in that it provides agreater setup time for the TDI and TMS inputs with respect to the risingedge of the TCK. Thus a higher TCK frequency may be used if TDI and TMSare input to the TAP domain 106 on the rising edge of TCK as shown intiming diagram 506. However, since the TDO output from the TAP domain106 operates on the falling edge of TCK it limits any potential increasein frequency provided by having rising edge TDI and TMS input to the TAPdomain 106. One way of improving the operating frequency of theinterface 501 is to modify the TAP domain to where it outputs TDO on therising edge of TCK.

FIG. 5A illustrates the reduced DDR interface arrangement of FIG. 5which includes a TAP domain 508 that has been modified to output TDO onthe rising edge of TCK. As seen in timing diagram 510, since TDO isoutput to the TAP controller 302 on the rising edge of TCK, whichprovides a greater TDO setup time to the TAP controller 302 with respectto the rising edge of TCK, the interface 501 can operate at higher TCKfrequencies.

FIG. 6 illustrates the complete reduced pin DDR interface 501 betweenTAP controller 302 and TAP domain 106 of device 502 of FIG. 5 modifiedto use the DDR circuit 402 of FIG. 4 instead of DDR circuit 202 of FIG.3. The interface of FIG. 6 operates exactly as the interface of FIG. 5with the exception that DDR circuit 402 has been substituted for DDRcircuit 202. Also the flip flops 208-214 and 404-406 of DDR circuit 402have been modified to include the preset inputs (PR) mentioned in regardto FIG. 5 to provide for them to be preset high in response to a TRSTinput from POR circuit 110 for the reasons mentioned in FIG. 5. Thereason to use DDR circuit 402 in place of DDR circuit 202 is to make theTDI and TMS input timing to TAP domain 106 match the falling edge TCKtiming suggested in the IEEE 1149.1 standard. As seen in operationtiming diagram 602, the DDR circuit 402 inputs the TDI and TMS signalsto the TAP domain on the falling edge of TCK as opposed to inputtingthem on the rising edge as seen in the timing diagram 505 of FIG. 5.

Since the reduced pin JTAG interfaces of FIGS. 5, 5A, and 6 use highspeed DDR interfaces for inputting TDI and TMS from a single TDI/TMSsignal, the performance of the reduced pin JTAG interfaces can matchthat of the full pin JTAG interface of FIG. 1. For example, if the fullpin JTAG interface of FIG. 1 can operate at a TCK rate of 50 Mhz, thereduce pin JTAG interfaces of FIGS. 5, 5A, and 6 can also operate at 50Mhz. With a 50 Mhz operation of the reduced pin JTAG interfaces, the TDIand TMS signal components are transmitted at 100 Mhz using the risingand falling edges of the 50 Mhz TCK, which is a reasonable transmissionrate for signals transmitted using DDR interfaces. Thus using DDRcircuitry, the reduced pin JTAG interface of the disclosure does notdegrade the performance of JTAG interfaces, as do the reduced pininterfaces mentioned in the background section of this description.

FIG. 7 illustrates an example of a TAP controller 702 interfaced to aplurality of devices 502 via point to point reduced pin DDR interfaces501. The devices 502 could be the device of FIG. 5, the device of FIG.5A, or the device of FIG. 6. To access the devices 502, the TAPcontroller 702 requires a TAP controller 302 for each device 502interface 501. While the point to point device access arrangement ofFIG. 7 is useful in many types test, debug, and programming accessapplications, it would be advantageous if each device 502 could also beselectively accessed by a single interface 501 to a TAP controller 302as shown in FIG. 8.

FIG. 8 illustrates an arrangement where a plurality of devices 802 arecoupled to a single TAP controller 302 via a single interface bus 501.The devices 802 are similar to device 502 with the exception that theyhave been modified to provide for interface bus 501 to selectivelyaccess the devices individually. The bussed arrangement of FIG. 8 isuseful for device test, debug, and/or programming operations when thedevices 802 are embedded on a substrate that can only support oneinterface 501. The following description describes how the reduce pinDDR interface and circuitry is modified to provide for the bussed accessarrangement to devices 802 of FIG. 8.

FIG. 9 illustrates the reduced pin DDR interface 501 between TAPcontroller 302 and TAP domain 106 of a device 802. The reduced pin DDRinterface circuitry of device 802 is the same as device 502 of FIGS. 5,5 a, and 6 with the exception that device 802 includes an addressableTAP interface circuit 902 located between the DDR circuit 202 and TAPdomain 106. While DDR circuit 202 is shown being used in FIG. 9, DDRcircuit 402 could be used as well. Also while TAP domain 106 is shownbeing used in FIG. 9, TAP domain circuit 508 could be used as well. Theaddressable TAP interface 902 has a first bus 904 coupled to the TDOsignal to TAP controller 302, the TRST signal from POR 110, the TCKsignal from TAP controller 302, and the TMS and TDI signals from DDRcircuit 202. The addressable TAP interface 902 has a second bus 906coupled to the TDO signal from TAP domain 106 and the TRST, TCK, TMS,and TDI signals to TAP domain 106. The addressable TAP interface 902operates to selectively couple or de-couple busses 904 and 906.

FIG. 10 illustrates the addressable TAP interface 902 of FIG. 9 in moredetail, which comprises a shadow protocol circuit 1002, And gate 1004,and TDO 3-state buffer 1006. Addressable TAP interface circuit 902inputs the TDI, TCK, TMS and TRST signals from bus 904, outputs a TDOsignal to bus 904, and outputs an enable (ENA) signal 1008 to And gate1004 and TDO 3-state buffer 1006. The ENA signal 1008 enables And gate1004 and 3-state buffer 1006, to provide for bus 904 to be fully coupledto bus 906. When bus 906 is fully coupled to bus 904, the TAP domain 106of FIG. 9 may be accessed by the TAP controller 302 via the reduce pinDDR interface 501.

FIG. 11 illustrates the shadow protocol circuit 1002 in more detail,which comprises a shadow protocol detection circuit 1102 and an addresscircuit 1104. The shadow protocol detection circuit 1102 inputs the TDI,TCK, TMS and TRST signals from bus 904 and a match signal from addresscircuit 1104. The detection circuit 1102 outputs an address input (AI)signal and address control (AC) signals to address circuit 1104 and theENA signal 1008 to And gate 1004 and 3-state buffer 1006 of FIG. 10.

When the JTAG bus 904 is in the RunTest/Idle state 1202, the Pause-DRstate 1204, or the Pause-IR state 1206 of the IEEE 1149.1 TAP statediagram 1201 of FIG. 12A, the Detection circuit 1102 is enabled torespond to a shadow protocol message 1107 input on TDI to input addressdata to the address circuit 1104. If the JTAG bus 904 is not in one ofthese states 1202-1206, the detection circuit 1102 is disabled fromresponding to the message 1107. The detection circuit 1102 is reset bythe TRST signal going low or by the JTAG bus 904 transitioning to theTest Logic Reset state of FIG. 12A.

The shadow protocol message 1107 consists of a start field 1108comprising an idle symbol (I) 1118 and a select symbol (S) 1120, anaddress field 1110 comprising a number of logic one or zero addresssymbols (A) 722 and 724, and a stop field 1112 comprising a selectsymbol (C) 1120 and an idle symbol (I) 1118. The symbols 1118-1124 areeach defined by a pair of logic bits, with the I symbol 1118 being twologic ones, the S symbol 1120 being two logic zeros, the logic zero Asymbol 1122 being a logic one followed by a logic zero, and the logicone A symbol 1124 being a logic zero followed by a logic one. As seen,the TCK times the symbol bit pair inputs on TDI. If desired the symbolbit pair definitions may be defined differently from that shown inexamples 1118-1124.

FIG. 12B illustrates the state diagram 1207 of the detection circuit1102. If the JTAG bus 904 is not in TAP states 1202, 1204, or 1206, thedetection circuit 1102 will be in the idle state 1208. If the JTAG bus904 is in state 1202, 1204 or 1206, the detection circuit 1102transitions to state 1210 to enable the detection of a shadow protocolmessage 1107. If a message start field 1108 occurs in state 1210 thedetection circuit 1102 transitions to state 1212 to input an addressfield 1110 to the address circuit 1104. When the stop field 1112 occursat the end of an address field input, the detection circuit transitionsto state 1214 to evaluate the match signal output from address circuit1106 to determine if the address input to the address circuit 1104matches the address of the devices reduced pin DDR interface. Thereduced pin DDR interface of each device will have a unique address. Ifit does not match, the detection circuit sets the ENA signal 1008 lowand transitions to state 1210. If it does match, the detection circuittransitions to state 1216 to set the ENA signal 1008 high thentransitions to state 1210. When the JTAG bus 904 transitions out of TAPstate 1202, 1204 or 1206 to resume JTAG operations, the detectioncircuit 1102 returns to the idle state 1208.

Following the above described shadow protocol message input 1107, theTAP domain 106 of the selected device 802 can be accessed by the TAPcontroller 302 via interface bus 501 of FIG. 9. When access to anotherdevice 802 TAP domain 106 is desired, the above described process isrepeated.

FIG. 12C illustrates an example implementation 1220 of the shadowprotocol detection circuit 1102, which consists of a state machine 1222and a TAP state monitor 1224. The TAP state monitor is basically an IEEE1149.1 TAP that is used to track the state of the JTAG bus 904. The TAPstate monitor 1224 outputs a RST signal 1227 and an Enable signal 1226to the state machine 1222. The TAP state monitor 1224 outputs a low onRST 1227 whenever the JTAG bus 904 transitions to the Test Logic Resetstate of FIG. 12A. The TAP state monitor 1224 outputs a high on theEnable signal 1226 to state machine 1222 whenever the JTAG bus 904 is inthe RunTest/Idle state 1202, the Pause-DR state 1204, or the Pause-IRstate 1206. If the Enable signal 1226 is low the JTAG bus 904 is not inone of these states and the state machine 1222 will be forced to theidle state 1208 of FIG. 12B. If the enable signal 1226 is high the JTAGbus 904 is in one of these states and the state machine 1222 willtransition to state 1210 of FIG. 12B to look for the start field 1108 ofa message 1107.

When a message is started, state machine 1222 will transition to state1212 of FIG. 12B to decode the address symbols (A) input from TDI duringaddress input field 1110 into logic one or zero bits and output thesebits on AI to the address circuit 1104. The state machine outputsaddress control (AC) to the address circuit 1104 to cause the AI bits tobe input to the address circuit 1104. In response to detecting the stopfield 1112 the state machine 1222 will transition to state 1214 tointerpret the Match signal from address circuit 1104 as previouslydescribed. If an address match is detected, the state machinetransitions to state 1216 to set the ENA signal 1008 high. If an addressmatch does not occur, the state machine sets the ENA signal 1108 low andtransitions to state 1210 of FIG. 12B.

In response to a low on TRST of JTAG bus 904, the state machine 1222,TAP state monitor 1224, and address circuit 1104 are reset. Also inresponse to the RST input 1227 from TAP state monitor 1224 the statemachine 1222, and address circuit 1104 are reset.

FIG. 12D illustrates an example implementation 1228 of the addresscircuit 1104, which comprises a shift register 1230, update register1232, comparator 1234, and device address 1236. The shift register 1230receives the address bit input (AI) and an A-Clock input from statemachine 1222. The A-clock input is a signal on the AC bus and is used toclock in the address bits from the AI input during state 1212 of FIG.12B. The update register 1232 inputs the parallel address output fromshift register 1230 in response to an A-Update signal from the AC bus.The update register 1232 outputs the updated address to comparator 1234during state 1214 of FIG. 12B. The comparator compares the addressoutput from the update register to the device address 1236. If theaddresses match, the Match signal from the comparator is set high. Ifthe addresses do not match, the Match signal from the comparator is setlow.

In response to a reset output from state machine 1222 on the AC bus, asa result of the state machine receiving a low on the TRST or RST input,the update register 1232 is reset to an address value that will notmatch the device address 1236. Also in response to a TRST or RST input,the state machine sets the ENA signal 1008 low to de-couple JTAG busses904 and 906 of FIG. 10.

It is common today for devices to contain more that one TAP domain 106.If the device is a board it most likely contains more than one IC eachwith a Tap domain. If the device is an IC it may include more than oneembedded core circuit each with a TAP domain. If the device is a core,it may contain further embedded cores each with a TAP domain. Thefollowing description illustrates how the reduced pin DDR interface andcircuitry of FIG. 9 is modified to support multiple TAP domains within adevice.

FIG. 13 illustrates the reduced pin DDR interface 501 between TAPcontroller 302 and plural TAP domains 106 of a device 1302. The reducedpin DDR interface circuitry of device 1302 is the same as device 502 ofFIGS. 5, 5 a, and 6 with the exception that device 1302 includes anaddressable TAP linking interface circuit 1304 located between the DDRcircuit 202 and plural TAP domains 106. While DDR circuit 202 is shownbeing used in FIG. 13, DDR circuit 402 could be used as well. Also whileTAP domain 106 is shown being used in FIG. 13, TAP domain circuit 508could be used as well. The addressable TAP linking interface 1304 has afirst bus 904 coupled to the TDO signal to TAP controller 302, the TRSTsignal from POR 110, the TCK signal from TAP controller 302, and the TMSand TDI signals from DDR circuit 202. The addressable TAP linkinginterface 1304 has plural second busses 906 each second bus beingcoupled to a particular one of the TAP domains via TDI, TDO, TMS, TCKand TRST signals. The addressable TAP linking interface 1304 operates toselectively couple or de-couple bus 904 to or from one or more buses906.

FIG. 14 illustrates the addressable TAP linking interface 1304 of FIG.13 in more detail, which comprises an addressable TAP interface 1402 anda TAP domain interface 1404. The addressable TAP interface 1402 iscoupled to bus 904 and interfaces to the TAP domain interface 1404 via abus 1406 which comprises TAP select (TAPSEL), TDI, TCK, TMS, TRST, andTDO signals. The TAP domain interface 1404 responds to the TAPSELsignals from bus 1406 to couple the TDI, TCK, TMS, TRST, and TDO signalsof bus 1406 to one or more of the TAP domain busses 906.

FIG. 15 illustrates the addressable TAP interface 1402 of FIG. 14 whichcomprises a shadow protocol circuit 1502, And gate 1004, and 3-statebuffer 1006. Addressable TAP interface circuit 1402 inputs the TDI, TCK,TMS and TRST signals from bus 904, outputs a TDO signal to bus 904,outputs TAPSEL signals to TAP domain interface 1404, outputs an enable(ENA) signal 1008 to And gate 1004 and TDO 3-state buffer 1006. TheTAPSEL output signals control the TAP domain interface 1404 to coupleone or more of the TAP domain 106 busses 906 to bus 1406. The ENA outputsignal 1008 enables And gate 1004 and TDO 3-state buffer 1006, toprovide for bus 904 to be fully coupled to one or more of busses 906 viaTAP domain interface 1404 and bus 1406. When a bus 906 is fully coupledto bus 904, the TAP domain 106 associated with bus 906 may be accessedby the TAP controller 302 via the reduce pin DDR interface 501.

FIG. 16 illustrates the shadow protocol circuit 1502 in more detail,which comprises a shadow protocol detection circuit 1602, commandcircuit 1604, and address circuit 1606. The shadow protocol detectioncircuit 1602 inputs the TDI, TCK, TMS and TRST signals from bus 904 anda match signal from address circuit 1606. The detection circuit 1602outputs a command input (CI) signal and command control signals (CC) tocommand circuit 1604 and an address input (AI) signal and addresscontrol signals (AC) to address circuit 1606. The command circuit 1604outputs the TAPSEL signal bus to TAP domain interface 1404.

When the JTAG bus 904 is in the RunTest/Idle state 1202, the Pause-DRstate 1204, or the Pause-IR state 1206 of the IEEE 1149.1 TAP statediagram 1201 of FIG. 12A, the Detection circuit 1602 is enabled torespond to a shadow protocol message 1607 input on TDI to input addressdata to the address circuit 1604 and command data to the command circuit1606. If the JTAG bus 904 is not in one of these states 1202-1206, thedetection circuit 1602 is disabled from responding to the message 1607.The detection circuit 1602 and all TAP domains 106 coupled to the TAPdomain interface 1404 are reset by the TRST signal going low or by theJTAG bus 904 transitioning to the Test Logic Reset state of FIG. 12A.

The shadow protocol message 1607 consists of a start field 1608comprising an idle symbol (I) 1618 and a select symbol (S) 1620, anaddress field 1610 comprising a number of logic one or zero addresssymbols (A) 1622 and 1624, a delimiter field 1612 comprising a selectsymbol (S) 1620, a command field 1614 comprising a number of logic oneor zero command symbols (C) 1622 and 1624, and a stop field 1616comprising a select symbol (S) 1620 and an idle symbol (I) 1618. Thesymbols 1618-1624 are each defined by a pair of logic bits, with the Isymbol 1618 being two logic ones, the S symbol 1620 being two logiczeros, the logic zero A or C symbol 1622 being a logic one followed by alogic zero, and the logic one A or C symbol 1624 being a logic zerofollowed by a logic one. As seen, the TCK times the symbol bit pairinputs on TDI. If desired the symbol bit pair definitions may be defineddifferently from that shown in examples 1218-1224.

FIG. 17 illustrates the state diagram 1701 of the detection circuit1602. If the JTAG bus 904 is not in TAP states 1202, 1204, or 1206, thedetection circuit 1602 will be in the idle state 1708. If the JTAG bus904 is in state 1202, 1204 or 1206, the detection circuit 1602transitions to state 1710 to enable the detection of a shadow protocolmessage 1607. If a message start field 1608 occurs in state 1710 thedetection circuit 1602 transitions to state 1712 to input an addressfield 1610 to the address circuit 1606. When the delimiter field 1612occurs at the end of an address field input, the detection circuittransitions to state 1714 to evaluate the match signal output fromaddress circuit 1606 to determine if the address input to the addresscircuit 1606 matches the address of the devices reduced pin DDRinterface circuit. If it does not match, the detection circuit sets theENA signal 1008 low to disable gate 1004 and buffer 1006 and transitionsto and remains in state 1710 for the remainder of the message 1607. Ifit does match, the detection circuit transitions to state 1716 to enablethe command circuit 1604 for receiving a command field 1614. When thestop field 1616 occurs at the end of the command field 1614 input, thedetection circuit transitions to state 1718 to output the command dataon the TAPSEL bus to select one or more TAP domains 106 for access andto set the ENA signal 1008 high to fully couple busses 904 and 1406 ofFIG. 15. From state 1718, the detection circuit 1602 transitions tostate 1710. When the JTAG bus 904 transitions out of state 1202, 1204 or1206 to resume JTAG operations, the detection circuit 1602 returns tothe idle state 1708.

Following the above described shadow protocol message input 1607, theselected TAP domain(s) 106 can be accessed by the TAP controller 302 viainterface bus 501 of FIG. 13. When access to another device TAP domain106 is desired, the above described process is repeated.

FIG. 18A illustrates an example implementation 1802 of the shadowprotocol detection circuit 1602, which consists of a state machine 1804and a TAP state monitor 1806. The TAP state monitor is basically an IEEE1149.1 TAP that is used to track the state of the JTAG bus 904. The TAPstate monitor 1806 outputs a RST signal 1808 and an Enable signal 1810to the state machine 1804. The TAP state monitor outputs a low on RST1808 whenever the JTAG bus 904 transitions to the Test Logic Reset stateof FIG. 12A. The TAP state monitor outputs a high on the Enable signal1808 to state machine 1804 whenever the JTAG bus 904 is in theRunTest/Idle state 1202, the Pause-DR state 1204, or the Pause-IR state1206. If the Enable signal is low the JTAG bus 904 is not in one ofthese states and the state machine will be forced to the idle state 1708of FIG. 17. If the enable signal 1810 is high the JTAG bus 904 is in oneof these states and the state machine will transition to state 1710 ofFIG. 17 to look for the start field 1608 of a message 1607.

When a message is started, state machine 1804 will transition to state1712 of FIG. 17 to decode the address symbols (A) input from TDI duringaddress input field 1610 into logic one or zero bits and output thesebits on AI to the address circuit 1606. The state machine outputsaddress control (AC) to the address circuit to cause the AI bits to beinput to the address circuit. In response to detecting the delimiterfield 1612 the state machine 1804 will transition to state 1714 tointerpret the Match signal from address circuit 1606 as previouslydescribed. If an address match is detected, the state machinetransitions to state 1716 to decode the command symbols (C) input fromTDI during command input field 1614 into logic one or zero bits andoutput these bits on CI to the command circuit 1606. If an address matchdoes not occur, state machine 1804 transitions to and remains in state1710 of FIG. 17. A transition from state 1714 to state 1710, as a resultof an address mismatch, sets the ENA signal 1004 output from statemachine 1804 low to disable And gate 1004 and TDO 3-state buffer 1006,which fully decouples bus 904 from bus 1406 of FIG. 15.

During command bit outputs to command circuit 1604, the state machine1804 outputs command control (CC) to the command circuit to cause thecommand bits to be input to the command circuit. In response to the stopfield 1616, the state machine 1804 stops command bit inputs to commandcircuit 1604, transitions to state 1718 of FIG. 17 to output control onCC to cause the command (TAPSEL bus) to be output from the commandcircuit 1604. Also in state 1718, the state machine 1804 sets the ENAsignal 1008 high to enable And gate 1004 and TDO 3-state buffer 1006 ofFIG. 15 to fully couple busses 904 and 1406.

In response to a low on TRST of JTAG bus 904, the state machine 1804,TAP state monitor 1806, address circuit 1606, and command circuit 1604are reset. Also in response to the RST input 1808 from TAP state monitor1806 the state machine 1804, address circuit 1606, and command circuit1604 are reset.

FIG. 18B illustrates an example implementation 1812 of the addresscircuit 1606, which comprises a shift register 1814, update register1816, comparator 1818, and device address 1820. The shift register 1814receives the address bit input (AI) and an A-Clock input from statemachine 1804. The A-clock input is a signal on the AC bus and is used toclock in the address bits from the AI input during state 1712 of FIG.17. The update register 1816 inputs the parallel address output fromshift register 1814 in response to an A-Update signal from the AC bus.The update register 1816 outputs the updated address to comparator 1818during state 1714 of FIG. 17. The comparator compares the address outputfrom the update register to the device address 1820. The device address1820 can be a hardwired address or a programmable address, and is uniquefor each device 1302. If the addresses match, the Match signal from thecomparator is set high. If the addresses do not match, the Match signalfrom the comparator is set low.

In response to a reset output from state machine 1804 on the AC bus, asa result of the state machine receiving a low on the TRST or RST input,the update register 1816 is reset to an address value that will notmatch the device address 1820.

FIG. 18C illustrates an example implementation 1822 of the commandcircuit 1604, which comprises a shift register 1824 and an updateregister 1826. The shift register 1824 receives the command bit inputs(CI) and a C-Clock input from state machine 1804. The C-clock input is asignal on the CC bus and is used to clock in the command bits from theCI input during state 1716 of FIG. 17. The update register 1826 inputsthe parallel command output from shift register 1824 in response to aC-Update signal from the CC bus during state 1718 of FIG. 17. The updateregister 1826 outputs the updated command to the TAPSEL bus.

In response to a reset output from state machine 1804 on the CC bus, asa result of the state machine receiving a low on the TRST or RST input,the update register 1826 is reset to a value where the TAPSEL bus 520does not select a TAP domain 106 via a bus 906. Also in response to aTRST or RST input, the state machine sets the ENA signal low to fullydecouple busses 904 and 1406 of FIG. 15.

FIG. 19 illustrates the TAP domain interface 1404 of FIG. 14 in moredetail. The TAP domain interface comprises a TAP domain linking circuit1902. The TAP domain linking circuit 1902 is coupled to bus 1406 fromthe addressable TAP interface circuit 1402 and to TAP domains 106 viabusses 906.

In response to selection input from the TAPSEL bus, and when only oneTAP domain 106 is being accessed, the linking circuit 1902 couples theJTAG signals of bus 1406 to a selected bus 906 such that; TDI of bus1406 drives TDI of selected bus 906, TCK of bus 1406 drives TCK ofselected bus 906, TMS of bus 1406 drives TMS of selected bus 906, andTDO of selected bus 906 drives TDO of bus 1406.

In response to a selection input from the TAPSEL bus, and when a firstand a second TAP domain 106 are being accessed in a daisy-chain, thelinking circuit 1902 couples the JTAG signals of bus 1406 to theselected first and second TAP domains 106, via their busses 906, suchthat; TDI of bus 1406 drives TDI of the first selected bus 906, TCK ofbus 1406 drives TCK of both first and second selected busses 906, TMS ofbus 1406 drives TMS of both first and second selected busses 906, TDO ofthe first selected bus 906 drives TDI of the second select bus 906, andTDO of the second selected bus 906 drives TDO of bus 1406.

The daisy-chaining of more than two TAP domains 106 is achieved bysimply inputting control on the TAPSEL bus to select more than two TAPdomains 106, which couples TCK and TMS of bus 1406 to all the selectedTAP domains via their busses 906, daisy-chains the TDI of bus 1406 tothe TDI of the first TAP domain via its bus 906, forms TDO to TDIcouplings between each intermediate TAP domain via their busses 906, andfinally coupling the TDO of bus 906 of the last selected TAP domain tothe TDO of bus 1406.

The reduced pin DDR interface 501 described thus far comprises threesignals, TDI/TMS, TCK, and TDO. The following description illustrateshow to reduce the number of interface signals down to only two throughthe use of simultaneously bi-directional transceiver circuitry.

FIG. 20 illustrates two circuits 2002 and 2004 communicating togetherusing simultaneously bi-directional transceivers (SBT1 and SBT2) 2006and 2008. SBT circuits are well known in the art of signalcommunication. SBT1 2006 is coupled to an input (IN1) and an output(OUT1) of a circuit 1 2010 of circuit 2002. SBT2 2008 is coupled to aninput (IN2) and an output (OUT2) of a circuit 2 2012 of circuit 2004.SBT circuits consist of an output buffer 2014, an input circuit (I)2016, and in some cases a register 2018 connected as shown. The outputbuffer 2018 drives a terminal coupled to I/O signal bus 2020 with thelogic level of the OUT1 and OUT2 signals from circuits 2010 and 2012,the input circuit 2016 evaluates the voltage level on the I/O signal bus2020 and inputs IN1 and IN2 signals to circuits 2010 and 2012, and theresistor, if used, serves to limit the current flow between SBT outputbuffers 2014 when the output buffers transmit opposite logic levels. SBTcircuits operate by communicating one of three logic levels on the I/Osignal bus 2020, a high voltage, a middle voltage, and a low voltage.

The functional operation of the SBT circuits of FIG. 20 is bestdescribed by the case statements A-D 2022 shown in FIG. 20 andoperationally illustrated in FIG. 21. As can be seen for each case A-D,the OUT1 and OUT2 signal outputs of circuits 2010 and 2012 aresimultaneously input to the IN2 and IN1 signal inputs of circuits 2010and 2012, respectively via the I/O signal bus 2020. A more detaileddescription of the operation of the example SBT circuits of FIGS. 20 and21 is provided in the 2006 IEEE ITC Whetsel paper referenced in thebackground section of this disclosure.

FIG. 22 illustrates the FIG. 20 example whereby the circuit 1 2010 ofcircuit 2002 is replaced by TAP controller 302 and circuit 2012 ofcircuit 2004 is replaced by a DDR TAP domain 2202 with a three signalinterface 501. The DDR TAP domain 2202 could be the DDR TAP domain ofthe devices 502 of FIG. 5, 5A, or 6, which comprise a DDR circuit 202 or402, a TAP domain circuit 106 or 508, and a POR circuit 110. The PUcircuit 105 of FIGS. 5, 5A, and 6 is not required since that function isprovided by circuitry within the SBT 2008. TAP controller 302 and DDRTAP domain 2202 operate as previously described in FIGS. 5, 5A, and 6,with the exception that SBT circuits 2006 and 2008 are used to“simultaneously” communicate the TDO signal from the DDR TAP domain 2202to the TAP controller 302 and the TDI/TMS signal from the TAP controller302 to the DDR TAP domain 2202 via I/O signal bus 2020.

The operation of the SBT based DDR interface of FIG. 22 is illustratedin timing diagram 2206. The I/O signal bus 2020 simultaneously inputsthe TDI component of TDI/TMS from TAP controller 302 and outputs the TDOsignal from DDR TAP domain 2202, via SBT 2006 and 2008, during I/O times2208. The I/O signal bus 2020 simultaneously inputs the TMS component ofTDI/TMS from TAP controller 302 and outputs the TDO signal from DDR TAPdomain 2202, via SBT 2006 and 2008, during I/O times 2210. As seen, adelay circuit 2204 has been inserted into the TDO signal path from theDDR TAP domain 2202 and SBT circuit 2008. This delay circuit is used tomove the falling edge TDO output signal from DDR TAP domain 2202 awayfrom the falling edge 226 of the TCK signal from TAP controller 302.This eliminates the TDO output transition from DDR TAP domain 2202 frominterfering with the falling edge 226 sampling (clocking) of the TMScomponent into the DDR circuit 202 of DDR TAP domain 2202 during I/Otimes 2210. With the exception that the TDI/TMS and TDO signals arebi-directionally transmitted on I/O bus 2020 using SBT circuits 2006 and2008, the timing operation of the TAP controller 302 and DDR TAP domain2202 are the same as the timing diagram 506 of FIG. 5. While timingexample 2206 illustrates how the timing diagram 506 of FIG. 5 operateswhen SBT circuits 2006 and 2008 are used, the timing diagrams of FIGS.5A and 6 could operate equally well when SBT circuits 2006 and 2008 areused as illustrated in FIGS. 22A and 22B, respectively.

FIG. 23 illustrates the FIG. 20 example whereby the circuit 1 2010 ofcircuit 2002 is replaced by TAP controller 302 and circuit 2012 ofcircuit 2004 is replaced by a DDR TAP domain 2302 with a three signalinterface 501. The DDR TAP domain 2302 could be the DDR addressable TAPdomain of device 802 of FIG. 9 which comprises a DDR circuit 202,addressable TAP interface circuit 902 TAP domain 106, and POR 110 TheDDR TAP domain 2302 could also be the DDR addressable TAP linking domainof device 1302 of FIG. 13 which comprise a DDR circuit 202, addressableTAP linking circuit 1304, plural TAP domain circuits 106, and a PORcircuit 110. TAP controller 302 and DDR TAP domain 2302 operate aspreviously described in FIGS. 9 and 13 with the exception that SBTcircuits 2006 and 2304 are used to “simultaneously” communicate the TDOsignal from the DDR TAP domain 2302 to the TAP controller 302 and theTDI/TMS signal from the TAP controller 302 to the DDR TAP domain 2302via I/O signal bus 2020.

As seen, the output buffer 2014 of SBT circuit 2304 has been changed toa 3-state output buffer 2305 and the ENA signal 1008 from shadowprotocol circuit 1008 of FIG. 10 or from shadow protocol circuit 1502 ofFIG. 15 of the DDR TAP domain 2302 is output to control the 3-stateoutput buffer 2305. Also, circuits 902 and 1402 have been modified toremove the 3-state buffer 1006 from the TDO signal path. 3-state buffer2305 serves the purpose previously provided by the 3-state buffer 1006of circuits 902 and 1402, that being to provide for TDO from DDR TAPdomain 2302 to drive the I/O bus 2020 to the TAP controller 302 whendevice 2004 is addressed. This provide for the SBT interface of FIG. 23to operate in the addressable device arrangement of FIG. 8, i.e. when adevice 2004 is addressed, the 3-state output buffer 2305 of thatdevice's SBT 2304 is enabled to communicate TDO data to the TAPcontroller 302 via the I/O bus 2020. When addressed a device's DDR TAPinterface 2302 communicates with the TAP controller 302 via the SBTcircuits 2006 and 2304 as shown in the timing diagrams of FIGS. 22, 22A,and 22B.

Although the disclosure has been described in detail, it should beunderstood that various changes, substitutions and alterations may bemade without departing from the spirit and scope of the disclosure asdefined by the appended claims.

What is claimed is:
 1. An integrated circuit comprising: A. a TDI/TMSinput lead; B. a TCK input lead carrying a TCK clock signal havingalternating rising and falling edges; C. a double data rate circuithaving a TDI/TMS input coupled to the TDI/TMS input lead, a TCK inputcoupled to the TCK input lead, and separate TDI and TMS signal outputleads, the double data rate circuitry including: i. a TDI circuit pathhaving an input connected to the TDI/TMS input and an output connectedto the TDI output lead, and ii. a TMS circuit path having an inputconnected to the TDI/TMS input and an output connected to the TMS outputlead, iii. the circuit paths including flip-flops having clock inputscoupled with the TCK input for changing output states on the edges ofthe TCK clock signal, and the circuit paths receiving alternating TDIand TMS signals on the TDI/TMS input at alternating edges of the TCKclock signal and providing a TDI signal on the TDI signal output leadand a TMS signal on the TMS signal output lead that both change stateson the same edge of the TCK clock signal, iv. each of the flip-flopshaving a preset input to set the flip-flops in a high state at power up;and D. a TAP domain having separate input leads coupled to the separateTDI and TMS signal output leads, and an input coupled to the TCK inputlead.
 2. The integrated circuit of claim 1 in which the flip-flopseffect a time delay between receiving a TDI signal at the TDI/TMS inputand providing the TDI signal at the TDI signal output lead, and betweenreceiving a TMS signal at the TDI/TMS input and providing the TMS signalat the TMS signal output lead.
 3. The integrated circuit of claim 1including a TDO output lead coupled with a TDO output of the TAP domain.4. The integrated circuit of claim 1 in which the TAP domain includes aTDO output and including TDO output circuitry coupling the TDO outputwith the TDI/TMS input lead.
 5. The integrated circuit of claim 1 inwhich a TDI signal on the TDI signal output lead and a TMS signal on theTMS signal output lead both change states on the falling edge of the TCKsignal.
 6. The integrated circuit of claim 1 in which a TDI signal onthe TDI signal output lead and a TMS signal on the TMS signal outputlead both change states on the rising edge of the TCK signal.
 7. Theintegrated circuit of claim 1 in which the TAP domain includes a statemachine having a Test Logic Reset state and in which a high state of theflip-flops at power up maintains the state machine in the Test LogicReset state.